IEEE design & test
Bibliographic Information
International Title: |
IEEE design & test |
p-ISSN: |
2168-2356 Period: [2013 .. ] |
e-ISSN: |
2168-2364 Period: [2013 .. ] |
Language: |
English |
Country of publication: |
United States |
URL: |
http://ieeexplore.ieee.org/xpl/RecentIssue.jsp[..] |
Continues: |
IEEE Design & Test of Computers |
Publishing House: |
IEEE (Institute of Electrical and Electronics Engineers) |
ITAR Code: |
1025838 |
NPI Scientific Field: |
ICT |
Minimum Criteria
| ✅ Scientific editorial board |
| ✅ Peer reviewed |
| ✅ International authorship |
| ✅ Approved ISSN |
Open Access
Indexed by Sherpa Romeo
- Checked 0 days ago
Scientific level placements and Norwegian HEIs publication points
| Year | Scientific Level | Author Shares | Publication Points |
|---|---|---|---|
| 2024 | 1 |
|
|
| 2023 | 1 | 0.125 | 0.4596 |
| 2022 | 1 | 0.0 | 0.0 |
| 2021 | 1 | 0.0 | 0.0 |
| 2020 | 1 | 0.0 | 0.0 |
| 2019 | 1 | 0.0 | 0.0 |
| 2018 | 1 | 0.0 | 0.0 |
| 2017 | 1 | 0.0 | 0.0 |
| 2016 | 1 | 0.0 | 0.0 |
| 2015 | 1 | 0.1429 | 0.4914 |
| 2014 | 1 | 0.0 | 0.0 |
| 2013 | 1 | 0.0 | 0.0 |
| Published in May the following year | |||
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